Tuesday, March 8, 2016

IEEE Xplore Integrates Altmetric Data

The inclusion of Altmetric badges enables authors, researchers, and other platform visitors to easily see a collated record of the online shares and discussion relating to an individual article from a variety of sources. These sources include news and social media, public policy documents, post-publication review forums, online reference managers and Wikipedia. These mentions are tracked from the point of publication onwards and updated in real time. Read more- Full press release .